1.

国際会議録
国際会議録
1. Health and cleanliness of the XMM-Newton science payload since launch [5898-29]
Kirsch, M. G. F. ; Abbey, A. ; Altieri, B. ; Baskill, D. ; Dennerl, K. ; van Dooren, J. ; Fauste, J. ; Freyberg, M. J. ; Gabriel, C. ; Haberl, F. ; Hartmann, H. ; Hartner, G. ; Meidinger, N. ; Metcalfe, L. ; Olabarri, B.
出版情報: UV, X-ray, and gamma-ray space instrumentation for astronomy XIV : 1-3 August 2005, San Diego, California, USA.  pp.58980S-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5898
2.

国際会議録
国際会議録
2. Growth of the ZnSe single crystals by chemical transport under microgravity. Results of the ground-based preparation.
Shcherbina-Samoilova, M. B. ; Hartmann, H. ; Regel, L. L. ; Trnka, J.
出版情報: Proceedings of the VIIth European Symposium on Materials and fluid Sciences in Microgravity : held in Oxford, UK, 10-15 September 1989.  pp.19-22,  1989.  Paris, France.  ESA Publications Division
シリーズ名: ESA SP
シリーズ巻号: 295
3.

テクニカルペーパー
テクニカルペーパー
3. Testing the Mechatronic Wedge Brake.
Roberts, R. ; Gombert, B. ; Hartmann, H. ; Lange, D. ; Schautt, M.
出版情報: 22nd Annual Brake Colloquium & Exhibition.  2004.  Warrendale, Penn..  Society of Automotive Engineers
シリーズ名: Society of Automotive Engineers technical paper series
シリーズ巻号: 2004
4.

テクニカルペーパー
テクニカルペーパー
4. The Electronic Wedge Brake - EWB.
Ho, L.M. ; Roberts, R. ; Hartmann, H. ; Gombert, B.
出版情報: 24th Annual Brake Colloquium & Exhibition : SAE technical paper.  2006.  Warrendale, Penn..  Society of Automotive Engineers
シリーズ名: Society of Automotive Engineers technical paper series
シリーズ巻号: 2006
5.

国際会議録
国際会議録
5. Advanced optical imaging platform for CD metrology and defect review on 130-nm to 100-nm node reticles: and overview of preliminary results
Hourd, A.C. ; Grimshaw, A. ; Scheuring, G. ; Gittinger, C. ; Brueck, H.-J. ; Chen, S.-B. ; Chen, P.W. ; Hartmann, H. ; Ordynskyy, V. ; Jonckheere, R.M. ; Philipsen, V. ; Schaetz, T. ; Sommer, K.
出版情報: 18th European Conference on Mask Technology for Integrated Circuits and Microcomponents.  pp.168-174,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4764
6.

国際会議録
国際会議録
6. Implementation of 248-nm based CD metrology for advanced reticle production
Hourd, A.C. ; Grimshaw, A. ; Scheuring, G. ; Gittinger, C. ; Doebereiner, S. ; Hillmann, F. ; Brueck, H.-J. ; Hartmann, H. ; Ordynskyy, V. ; Peter, K. ; Chen, S.-B. ; Chen, P.W. ; Jonckheere, R.M. ; Philipsen, V. ; Schaetz, T. ; Sommer, K.
出版情報: 19th European Conference on Mask Technology for Integrated Circuits and Microcomponents.  pp.148-157,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5148