1.

国際会議録
国際会議録
1. Big softer hole on living cells:elasticity imaging with AFM
Kawabata,K. ; Haga,H. ; Nitta,T. ; Endo,Y. ; Nagayama,M. ; Ito,E. ; Sambongi,T.
出版情報: Scanning and force microscopies for biomedical applications : 23-24 January 2000, San Jose, California.  pp.91-98,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3922
2.

国際会議録
国際会議録
2. Formation of Oxygen Clusters in Quenched Cz- and MCz-Si Crystals
Ikari,A. ; Haga,H. ; Yoda,O. ; Uedono,A. ; Ujihira,Y.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.225-230,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118
3.

国際会議録
国際会議録
3. Oxygen Clusters in as-grown Cz-Si Crystals Probed by Positron Annihilation
Ikari,A. ; Kawakami,K. ; Haga,H. ; Uedono,A. ; Wei,L. ; Kawano,T. ; Tanigawa,S.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1583-1588,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
4.

国際会議録
国際会議録
4. Vacancy-Oxygen Complexes in Si Probed by Positron Annihilation
Uedono,A. ; Kawano,T. ; Li,X.H. ; Wei,L. ; Tanigawa,Sh. ; Ikari,A. ; Kawakami,K. ; Haga,H. ; Itoh,H.
出版情報: Positron annihilation : ICPA-10 : Proceedings of the 10th International Conference on Positron Annihilation, May 23-29, 1994, Beijing, China.  Part1  pp.553-556,  1995.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 175-178
5.

国際会議録
国際会議録
5. Influence of Point Defect Concentration in Growing CZ-Si on the Formation Temperature of the Defects Affecting Gate Oxide Integrity
Iwasaki,T. ; Harada,H. ; Haga,H.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1731-1736,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
6.

国際会議録
国際会議録
6. Compact imaging apparatus for a pen-shaped handheld scanner
Haga,H. ; Fujieda,I. ; Okumura,F.
出版情報: Solid state sensor arrays : development and applications : 10-11 February 1997, San Jose, California.  pp.168-173,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3019