1.

国際会議録
国際会議録
1. The Effects of Process Variations on Residual Stress Induced by Laser Peening
Rankin, J.E. ; Hill, M.R. ; Halpin, J. ; Chen, H.-L. ; Hackel, L.A. ; Harris, F.
出版情報: ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002.  pp.95-100,  2002.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 404-407
2.

国際会議録
国際会議録
2. Improving 351-nm damage performance of large-aperture fused silica and DKDP optics
Burnham, A.K. ; Hackel, L.A. ; Wegner, P.J. ; Parham, T.G. ; Hrubesh, L.W. ; Penetrante, B.M. ; Whitman, P.K. ; Demos, S.G. ; Menapace, J.A. ; Runkel, M. ; Fluss, M.J. ; Feit, M.D. ; Key, M.H. ; Biesiada, T.A.
出版情報: Laser-Induced Damage in Optical Materials: 2001.  pp.173-185,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4679
3.

国際会議録
国際会議録
3. Methods for mitigating surface damage growth in NIF final optics
Hrubesh, L.W. ; Norton, M.A. ; Molander, W.A. ; Donohue, E.E. ; Maricle, S.M. ; Penetrante, B.M. ; Brusasco, R.M. ; Grundler, W. ; Butler, J.A. ; Carr, J.W. ; Hill, R.M. ; Summers, L.J. ; Feit, M.D. ; Rubenchik, A.M. ; Key, M.H. ; Wegner, P.J. ; Burnham,A.K. ; Hackel, L.A. ; Kozlowski, M.R.
出版情報: Laser-Induced Damage in Optical Materials: 2001.  pp.23-33,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4679