Methods of Design and Characterization of Materials, Research and Development of Technological Processes : selected, peer reviewed papers from the Chinese Materials Conference 2015, July 10-14, 2015, Guiyang, China. pp.469-481, 2016. Aedermannsdorf, Switzerland. Trans Tech Publications
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63574L-1-63574L-4, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Conference on Photonics and Imaging in Biology and Medicine. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Conference on Photonics and Imaging in Biology and Medicine. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China. pp.716030-1-716030-8, 2009. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Multispectral, hyperspectral, and ultraspectral remote sensing technology, techniques, and applications II : 18-20 November 2008, Noumea, New Caledonia. pp.71490S-1-71490S-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced sensor technologies and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China. pp.71571E-1-71571E-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering