1.

国際会議録
国際会議録
1. Evaluation with Surface Analysis Equipment, of Casting Defects in Cast Iron Articles (review)
H. Kambayashi ; Y. Kurokawa ; H. Ota ; Y. Hoshiyama ; H. Miyake
出版情報: THERMEC 2006 : supplement to THERMEC 2006, 5th International conference on processing and manufacturing of advanced materials, July 4-8, 2006, Vancouver, Canada.  539-543  pp.1110-1115,  2007.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 539-543(2)
2.

国際会議録
国際会議録
2. GaN MOSFETs with Large Current and Normally-off Operation
Y. Niiyama ; H. Kambayashi ; S. Ootomo ; N. Ikeda ; T. Nomura
出版情報: State-of-the-Art Program on Compound Semiconductors 49 (SOTAPOCS 49) and Nitrides and Wide-Bandgap Semiconductors for Sensors, Photonics, and Electronics 9.  pp.161-168,  2008.  Pennington, NJ.  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 16(7)