Emanuelsson,P. ; Gehlhoff, W. ; Omling, P. ; Grimmeiss, H.G.
出版情報:
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.307-312, 1990. Pittsburgh, Pa.. Materials Research Society
Proceedings of the Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials. pp.1200-1205, 1997. Pennington, NJ. Electrochemical Society
Thilderkvist, A. ; Grossman, G. ; Kleverman, M. ; Grimmeiss, H.G.
出版情報:
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.51-56, 1990. Pittsburgh, Pa.. Materials Research Society
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.3-14, 1990. Pittsburgh, Pa.. Materials Research Society
Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology. pp.37-52, 1994. Pennington, NJ. Electrochemical Society
ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands. pp.19-34, 1995. Pennington, NJ. Electrochemical Society