1.

国際会議録
国際会議録
1. Pure and deep-level doped semi-insulating CdTe
Hoschl,P. ; Grill,R. ; Franc,J. ; Belas,E. ; Turjanska,L. ; Turkevych,I. ; Benz,K.W. ; Fiederle,M.
出版情報: Hard X-ray and gamma-ray detector physics III : 30 July-1 August, 2001, San Diego, USA.  pp.273-281,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4507
2.

国際会議録
国際会議録
2. Transport properties of p-Hg1-xCdxTe(x=0.22)
Moravec,P. ; Grill,R. ; Franc,J. ; Hoschl,P. ; Belas,E.
出版情報: Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine.  pp.313-320,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3890
3.

国際会議録
国際会議録
3. Characterization of diffusion length of minority carriers in(CdZn)Te at temperatures of 80 to 300 K
Franc,J. ; Belas,E. ; Hlidek,P. ; Toth,A.L. ; Sitter,H. ; Grill,R. ; Hoschl,P. ; Moravec,P.
出版情報: Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine.  pp.163-169,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3890
4.

国際会議録
国際会議録
4. Determination of diffusion lengths of minority carriers in Hg1-xCdxTe (x｡ﾁ0.2 to 0.3) by EBIC method
Franc,J. ; Belas,E. ; Grill,R. ; Toth,A. ; Sitter,H. ; Moravec,P. ; Hoschl,P.
出版情報: Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine.  pp.207-215,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3182