A TEM INVESTIGATION OF SECONDARY DISLOCATINS IN GRAIN BOUNDARIES IN GERMANIUM

A TEM INVESTIGATION OF SECONDARY DISLOCATINS IN GRAIN BOUNDARIES IN GERMANIUM

著者名:

掲載資料名:

Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

163

発行年:

1990

開始ページ:

945

終了ページ:

950

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558990517 [1558990518]

言語:

英語

請求記号:

M23500/163

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015647
シリーズID:	PA00000011
会議名:	Symposium on impurities, defects, and diffusion in semiconductors
回次:	1989
会議開催地:	Boston, MA, USA
会議開催年:	1989.11.27-1989.12.01

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1 国際会議録 INVESTIGATION OF THE COBALT SEGREGATION AND THE STRUCTURE OF A GRAIN BOUNDARY IN SILICON' Tutken, T., Schroter, W., Moller, H.J. Materials Research Society	7 国際会議録 FORMATION OF MICRO-PRECIPITATES AT THE MELT-SOLID INTERFACE IN SEMICONDUCTORS Moller, H.J. Materials Research Society
2 国際会議録 PRECIPITATION OF COPPER AND COBALT AT GRAIN BOUNDARIES IN SILICON Jenrich, U., Moller, H.J. Materials Research Society	8 国際会議録 AN HREM INVESTIGATION INTO THE ATOMIC STRUCTURE OF AN ALUMINUM GRAIN BOUNDARY Hetherington, C. J. D., Dahmen, U., O'Keefe, M. A., Kilaas, R., Turner, J., Westmacott, K. H., Mills, M. J., Vitek, V. Materials Research Society
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