1.

国際会議録
国際会議録
1. Minimum description length principle applied to camouflage assessment
Ruppert,G.S. ; Wimmer,A. ; Bischof,H. ; Gretzmacher,F.M. ; Wendner,G.
出版情報: Targets and backgrounds VII : characterization and representation : 16-17 April 2001, Orland, USA.  pp.50-59,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4370
2.

国際会議録
国際会議録
2. Camouflage assessment considering human perception data
Gretzmacher,F.M. ; Ruppert,G.S. ; Nyberg,S.
出版情報: Targets and backgrounds : characterization and representation IV : 13-15 April 1998, Orlando, Florida.  pp.58-67,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3375
3.

国際会議録
国際会議録
3. FFT-descriptors for shape recognition of military vehicles
Wimmer,A. ; Ruppert,G.S. ; Sidla,O. ; Konrad,H. ; Gretzmacher,F.M.
出版情報: Targets and backgrounds VI : characterization, visualization, and the detection process : 24-26 April 2000, Orlando, USA.  pp.81-87,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4029
4.

国際会議録
国際会議録
4. Robust measure for camouflage effectiveness in the visual domain
Ruppert,G.S. ; Beichel,R. ; Gretzmacher,F.M.
出版情報: Targets and backgrounds VI : characterization, visualization, and the detection process : 24-26 April 2000, Orlando, USA.  pp.386-393,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4029
5.

国際会議録
国際会議録
5. Fuzzy logic approach for the quantitative assessment of camouflage effectiveness in the thermal infrared domain
Beichel,R. ; Ruppert,G.S. ; Gretzmacher,F.M.
出版情報: Targets and backgrounds VI : characterization, visualization, and the detection process : 24-26 April 2000, Orlando, USA.  pp.378-385,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4029