1.

国際会議録
国際会議録
1. Oxide chemical mechanical polishing closed-loop time control
Lutzen,J. ; Pal,S. ; Gonzales,S. ; Bar,Y.
出版情報: Process, equipment, and materials control in integrated circuit manufacturing V : 22-23 September, 1999, Santa Clara, California.  pp.36-44,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3882
2.

国際会議録
国際会議録
2. The Copper Pitting Corrosion Mechanism in Sodium Perchlorate Solutions of Different pH Values and the Influence of Benzotriazole as Corrosion Inhibitor
Gonzales,S. ; Souto,R.M. ; Sanchez,M.Perez ; Laz,M.M. ; Barrera,M. ; Salvarezza,R.C. ; Arvia,A.J.
出版情報: Electrochemical methods in corrosion research : proceedings of the 4th International Symposium, held in Espoo, Finland, July 1-4, 1991.  pp.103-122,  1992.  Aedemannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 111-112
3.

国際会議録
国際会議録
3. Quick kill passivation integrity study
Huber,K. ; Gonzales,S.
出版情報: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III.  pp.2-8,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3216
4.

国際会議録
国際会議録
4. Submicron metal etch integration study
Gonzales,S. ; Quijada,J. ; Grivna,G.
出版情報: Microelectronic Device and Multilevel Interconnection Technology II.  pp.301-311,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2875
5.

国際会議録
国際会議録
5. Gate-Length-and threshold-voltage-dependent nonlinearity in the hot carrier DC Lifetime extrapolation for sub-100-nm NMOS devices
Chheda,S.N. ; Bhat,N. ; Tsui,P. ; Gonzales,S. ; Cave,N. ; Fu,C.-C. ; Huang,F. ; Nangia,A. ; Choi,P.S.-J. ; Collins,S.
出版情報: Microelectronic Device Technology III.  pp.175-185,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3881