1.

国際会議録
国際会議録
1. The response time of GaN photoconductive detector under various ultraviolet-radiation intensities [5964-38]
Xu, J. ; Tang, Y. ; Li, X. ; Gong, H. ; Zhao, D.
出版情報: Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany.  pp.59640Z-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5964
2.

国際会議録
国際会議録
2. Research on zinc diffusion in undoped InP [5964-04]
Zhuang, C. ; Lv, Y. ; Gong, H.
出版情報: Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany.  pp.596404-596404,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5964
3.

国際会議録
国際会議録
3. Electrical shock effect on HgCdTe photoconductive detectors
Liu, D. ; Xu, G. ; Huang, Y. ; Li, X. ; Gong, H.
出版情報: Infrared components and their applications : 8-11 November 2004, Beijing, China.  pp.34-41,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5640
4.

国際会議録
国際会議録
4. Integrity of Copper-Tantalum Nitride Metallization Under Different Ambient Conditions
Yap, K.P. ; Gong, H. ; Dai, J.Y. ; Osipowicz, T. ; Chan, L.H. ; Lahiri, S.K.
出版情報: Low and High Dielectric Constant Materials : Materials Science, Processing, and Reliability Issues, proceedings of the fourth International Symposium and Thin Film Materials for Advanced Packaging Technologies : proceedings of the second International Symposium.  pp.195-208,  1999.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 99-7
5.

国際会議録
国際会議録
5. A demo imaging system based on GaN UV detectors [5964-45]
Huang, Y. ; Li, X. ; Gong, H.
出版情報: Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany.  pp.596414-596414,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5964
6.

国際会議録
国際会議録
6. Failure analysis of PC MCT caused by current [5964-46]
Liu, D. ; Wu, L. ; Yuan, Y. ; Zhang, L. ; Jin, X. ; Gong, H.
出版情報: Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany.  pp.596415-596415,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5964
7.

国際会議録
国際会議録
7. Four-band infrared detector for FY-2C application [5964-53]
Gong, H. ; Xu, G. ; Zhu, S. ; Qui, H. ; Li, X. ; Liu, D. ; Zhu, L. ; Lin, X. ; Zhang, Y. ; Fang, J.
出版情報: Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany.  pp.59640B-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5964
8.

国際会議録
国際会議録
8. Combine temporal clustering analysis with least square estimation to determine the dynamic pattern of cortical spreading depression [6085-09]
Chen, S. ; Li, P. ; Gong, H. ; Zeng, S. ; Luo, Q.
出版情報: Complex dynamics and fluctuations in biomedical photonics III : 21 and 24 January 2006, San Jose, California, USA.  pp.60850D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6085
9.

国際会議録
国際会議録
9. Study on the limit of linear response of MCT photodiode
Gao, G. ; Qiu, H. ; Huang, Y. ; Gong, W. ; Gong, H.
出版情報: Infrared components and their applications : 8-11 November 2004, Beijing, China.  pp.671-679,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5640
10.

国際会議録
国際会議録
10. 64×1 UV focal plane array of GaN p-i-n photodiodes (Invited Paper)
Kang, Y. ; Li, X. ; Xu, Y. ; Tang, Y. ; Zhang, S. ; Xie, W. ; Gong, H. ; Fang, J.
出版情報: Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China.  pp.78-85,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5633