1.

国際会議録
国際会議録
1. Current instabilities in GaAs/InAs quantum dot structures
Horvath,Zs.J. ; Podor,B. ; Frigeri,P. ; Franchi,S. ; Gombia,E. ; Mosca,R. ; Tuyen,V.Van ; Dozsa,L.
出版情報: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.153-156,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4413
2.

国際会議録
国際会議録
2. Effect of Neutron Bombardment on the Electrical Characteristics of n-GaAs
Horvath,Zs.J. ; Gombia,E. ; Pal,D. ; Mosca,R. ; Capannese,G. ; dozsa,L. ; Tuyen,Vo Van
出版情報: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part1  pp.230-233,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3975
3.

国際会議録
国際会議録
3. Characterization of EL2 Level in As-Grown GaAs Prepared by MBE
Smid,V. ; Hubik,P. ; Bosacchi,A. ; Franchi,S. ; Gombia,E. ; Vanzetti,L.
出版情報: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.135-139,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 38-41
4.

国際会議録
国際会議録
4. Hole Capture by the DX Center in AlGaAs Schottky Barriers
Mosca,R. ; Gombia,E. ; Ghezzi,C. ; Frigeri,P. ; Bosacchi,A. ; Franchi,S.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1111-1116,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
5.

国際会議録
国際会議録
5. Hydrogenation of GaAs during MBE Growth
Bosacchi,A. ; Franchi,S. ; Gombia,E. ; Mosca,R. ; Allegri,P. ; Avanzini,V. ; Ghezzi,C.
出版情報: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part3  pp.1027-1032,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 38-41