1.

国際会議録
国際会議録
1. Flow simulation in a 3D model of pig airways and connection to lung sounds
Kruse,K.L. ; Williams,P.T. ; Allgood,G.O. ; Ward,R.C. ; Gleason,S.S. ; Paulus,M.J. ; Munro,N.B. ; Mahinthakumar,G. ; Narasimhan,C. ; Hammersley,J.R. ; Olson,D.E.
出版情報: Visualization of temporal and spatial data for civilian and defense applications : 19-17 April, 2001, Orlando, USA.  pp.168-176,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4368
2.

国際会議録
国際会議録
2. Adaptation of the fuzzy k-nearest neighbor classifier for manufacturing automation
Tobin,K.W.,Jr. ; Gleason,S.S. ; Karnowski,T.P.
出版情報: Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California.  pp.122-130,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3306
3.

国際会議録
国際会議録
3. Fuzzy logic connectivity in semiconductor defect clustering
Karnowski,T.P. ; Gleason,S.S. ; Tobin,K.W.,Jr.
出版情報: Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California.  pp.44-53,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3306
4.

国際会議録
国際会議録
4. Feasibility of telemammography as biomedical application for breast imaging
Beckerman,B.G. ; Batsell,S.G. ; Maclntyre,L.P. ; Sarraf,H.S. ; Gleason,S.S. ; Schnall,M.D.
出版情報: Biomedical diagnostic, guidance, and surgical-assist systems : 26-27 January 1999, San Jose, California.  pp.49-60,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3595
5.

国際会議録
国際会議録
5. Rapid yield learning through optical defect and electrical test analysis
Gleason,S.S. ; Tobin,K.W. ; Karnowski,T.P. ; Lakhani,F.
出版情報: Metrology, inspection, and process control for microlithography XII : 23-25 February 1998, San Clara, California.  pp.232-242,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3332
6.

国際会議録
国際会議録
6. An Integrated Spatial Signature Analysis and Automatic Defect Classification System
Gleason,S.S. ; Tobin,K.W. ; Karnowski,T.P.
出版情報: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.204-211,  1997.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3322
7.

国際会議録
国際会議録
7. Part identification using robust feature extraction and pattern classification
Hunt,M.A. ; Hicks,J.S. ; Gleason,S.S.
出版情報: Machine vision applications in industrial inspection IV : 31 January-1 February, 1996, San Jose, California.  pp.219-230,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2665
8.

国際会議録
国際会議録
8. High-resolution x-ray CT screening of mutant mouse models
Paulus,M.J. ; Gleason,S.S. ; Sari-Sarraf,H. ; Johnson,D.K. ; Foltz,C.J. ; Austin,D.W. ; Easterly,M.E. ; Michaud,E.J. ; Dhar,M.S. ; Hunsicker,P.R. ; Wall,J.W. ; Schell,M.
出版情報: Optical diagnostics of living cells III : 24-25 January 2000, San Jose, California.  pp.270-279,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3921
9.

国際会議録
国際会議録
9. Automatic screening of polycystic kidney disease in x-ray CT images of laboratory mice
Gleason,S.S. ; Sari-Sarraf,H. ; Paulus,M.J. ; Johnson,D.K. ; Abidi,M.A.
出版情報: Medical Imaging 2000: Image Processing.  Part2  pp.837-846,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3979
10.

国際会議録
国際会議録
10. Image paradigm for semiconductor defect data reduction
Tobin,K.W. ; Gleason,S.S. ; Karnowski,T.P. ; Sari-Sarraf,H. ; Bennett,M.H.
出版情報: Metrology, Inspection, and Process Control for Microlithography X.  pp.194-205,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2725