1.

国際会議録
国際会議録
1. A Technique for Measuring the Film Thickness of Ultrathin Metallic Thin Films, 4-20 nm, Using Atomic Force Microscopy
G. Acosta ; D.D. Allred ; R.C. Davis
出版情報: 48th annual technical conference proceedings, April 23-28, 2005, Denver, Colorado.  pp.707-713,  2005.  Albuquerque, NM.  Society of Vacuum Coaters
シリーズ名: Annual Technical Conference of Society of Vacuum Coaters
シリーズ巻号: 48
2.

国際会議録
国際会議録
2. Nanoscale Characterization of Thin Film Coatings Using Annular Dark Field Scanning Transmission Electron Microscopy
G. Acosta ; R. Vanfleet ; D. Allred ; R.S. Turley
出版情報: 51st annual technical conference proceedings, April 19-24, 2008, Chicagom, IL.  pp.443-447,  2008.  Albuquerque, NM.  Society of Vacuum Coaters
シリーズ名: Annual Technical Conference of Society of Vacuum Coaters
シリーズ巻号: 51