1.

国際会議録
国際会議録
1. In Situ Fracture and Adhesion Failure of Al-Cu-Fe Quasicrystalline Films
Daniels, M.J. ; French, B.L. ; King, David ; Bilello, J.C.
出版情報: Surface engineering 2002 - synthesis, characterization and applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.243-248,  2003.  Warrendale, Penn.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 750
2.

国際会議録
国際会議録
2. Correlation of Stress and Phase Evolution in Thin Ta Films on Si (100) During Thermal Testing
French, B.L. ; Bilello, J.C.
出版情報: Surface engineering 2002 - synthesis, characterization and applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.367-372,  2003.  Warrendale, Penn.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 750
3.

国際会議録
国際会議録
3. Real-Time In Situ Imaging of the Delamination of Thin Ta Films on Si(100) Substrates Via a Synchrotron Radiation Technique
French, B.L. ; Bilello, J.C.
出版情報: Thin films : stresses and mechanical properties IX : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A..  pp.385-390,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 695