1.

国際会議録
国際会議録
1. Interface formation between Al and Ca with tris-(8-hydroxyquinoline)aluminum
Le,Q.T. ; Mason,M.G. ; Yan,L. ; Choong,V.-E. ; Forsythe,E.W. ; Tang,C.W. ; Gao,Y.
出版情報: Organic photonic materials and devices : 25-27 January 1999, San Jose, California.  pp.64-70,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3623
2.

国際会議録
国際会議録
2. Characterization of treated indium tin oxide surface and interface formation between treated ITO with phenyl-diamine
Le,Q.T. ; NUesch,F. ; Forsythe,E.W. ; Rothberg,L.J. ; Cao,Y.
出版情報: Organic light-emitting materials and devices III : 19-21 July 1999, Denver, Colorado.  pp.301-308,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3797
3.

国際会議録
国際会議録
3. Energy alignment and trap states in dye-doped tris-8-(hydroxyquinoline)aluminum light-emitting devices
Forsythe,E.W. ; Morton,D.C. ; Le,Q.T. ; Yan,L. ; Nuesch,F. ; Tang,C.W. ; Gao,Y.
出版情報: Organic photonic materials and devices : 25-27 January 1999, San Jose, California.  pp.13-19,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3623
4.

国際会議録
国際会議録
4. Trap states in electroluminescent SrS:Cu phosphor thin films using thermally stimulated luminescence
Morton,D.C. ; Forsythe,E.W. ; Sun,S.-S.
出版情報: Flat panel display technology and display metrology : 27-29 January 1999, San Jose, California.  pp.83-91,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3636
5.

国際会議録
国際会議録
5. Trap states in doped tris-8-(hydroxyquinoline)aluminum using thermally stimulated luminescence
Forsythe,E.W. ; Morton,D.C. ; Tang,C.W. ; Gao,Y.
出版情報: Organic Light-Emitting Materials and Devices II.  pp.123-130,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3476