1.

国際会議録
国際会議録
1. New principles of diagnostics of surface parameters of solids by methods of x-ray total external reflection
Balovsyak, S. V. ; Fodchuk, I. M.
出版情報: Sixth International Conference on Correlation Optics : 16-19 September 2003, Chernivtsi, Ukraine.  pp.198-205,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5477
2.

国際会議録
国際会議録
2. X-ray analysis of strain relaxation in multilayer systems InxGa1-xAS1-yNy/GaAs
Pessa, M. ; Pavelescu, E.-M. ; Fodchuk, I. M. ; Gevyk, V. B. ; Shpak, A. P. ; Molodkin, V. B. ; Kislovskii, E. N. ; Olikhovskii, S. I.
出版情報: Sixth International Conference on Correlation Optics : 16-19 September 2003, Chernivtsi, Ukraine.  pp.229-237,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5477