1.

国際会議録
国際会議録
1. ANALYSIS OF IRON PRECIPITATION IN SILICON AS A BASIS FOR GETIERING SIMULATIONS
Hieslmair, H. ; Istratov, A.A. ; McHugo, S.A. ; Flink, C. ; Weber, E.R.
出版情報: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1126-1137,  1998.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 98-1(2)
2.

国際会議録
国際会議録
2. ELECTRICAL AND RECOMBINATIVE PROPERTIES OF PRECIPTATED AND INTERSTITIAL COPPER IN SILICON
Istratov, A.A. ; Hedemann, H. ; Seibt, M. ; Vyvenko, O.F. ; Schroeter, W. ; Flink, C. ; Heiser, T. ; Hieslmair, H. ; Weber, E.R.
出版情報: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.948-972,  1998.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 98-1(2)
3.

国際会議録
国際会議録
3. Studies of the Microscopic Nature of Cu Pairs in Silicon
Istratov, A. A. ; Heiser, T. ; Hieslmair, H. ; Flink, C. ; Weber, E. R.
出版情報: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.355-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 510
4.

国際会議録
国際会議録
4. Charge State of Copper-Silicide Precipitates in Silicon and Its Application to the Understanding of Copper Precipitation Kinetics
Istratov, A. A. ; Vyvenko, O. F. ; Flink, C. ; Heiser, T. ; Hieslmair, H. ; Weber, E. R.
出版情報: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.313-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 510
5.

国際会議録
国際会議録
5. Formation of Subthreshold Defects in Erbium Implanted Silicon
Flink, C. ; Mui, S. ; Gottschalk, H. ; Palm, J. ; Weber, E. R.
出版情報: Silicon front-end technology--materials processing and modelling, symposium held April 13-15, 1998, San Francisco, California, U.S.A..  pp.177-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 532
6.

国際会議録
国際会議録
6. Direct Correlation of Solar Cell Performance With Metal Impurity Distributions in Polycrystalline Silicon Using Synchrotron-Based X-ray Analysis
McHugo, S. A. ; Thompson, A. C. ; Lamble, G. ; MacDowell, A. ; Celestre, R. ; Padmore, H. ; Imaizumi, M. ; Yamaguchi, M. ; Perichaud, I. ; Martinuzzi, S. ; Werner, M. ; Rinio, M. ; Moller, H. J. ; Sopori, B. ; Hieslmair, H. ; Flink, C. ; Istratov, A. ; Weber, E. R.
出版情報: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.297-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 524