Mendicino, L. ; Brown, P.T. ; Filipiak, S. ; Nauert, C. ; Estep, H. ; Fletcher, M.
出版情報:
Environmental issues with materials and processes for the electronics and semiconductor industries V : proceedings of the international symposium. pp.144-156, 2002. Pennington, N.J.. Electrochemical Society
Kirscht, F. ; Orschel, B. ; Kim, S. ; Rouvimov, S. ; Snegirev, B. ; Fletcher, M. ; Shabani, M. ; Buczkowski, A.
出版情報:
Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.173-178, 2002. Warrendale, Pa. Materials Research Society
Eikenberry, S. S. ; Elston, R. ; Raines, S. N. ; Julian, J. ; Hanna, K. ; Hon, D. ; Julian, R. ; Corley, R. ; Rashkin, D. ; Leckie, B. ; Gardhouse, W. R. ; Fletcher, M. ; Dunn, J. ; Wooff, R.
出版情報:
Ground-based instrumentation for astronomy : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.1187-1195, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Ground-based and Airborne Instrumentation for Astronomy. pp.626932-626932, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering