Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.863-874, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Materials science for high technologies : MASHTEC '90 : proceedings of the International Symposium held in Dresden, German Democtatic Republic April 24-27, 1990. Pt.1 pp.237-238, 1990. Aedermannnsdorf, Switzerland. Trans Tech Publications
Materials science for high technologies : MASHTEC '90 : proceedings of the International Symposium held in Dresden, German Democtatic Republic April 24-27, 1990. Pt.1 pp.385-386, 1990. Aedermannnsdorf, Switzerland. Trans Tech Publications
Advances in X-ray optics : 2-4 August 2000, San Diego, USA. pp.227-234, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
European powder diffraction : EPDIC IV : proceedings of the Fourth European Powder Diffraction Conference, held in Chester, England, July 1995. pp.301-306, 1996. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Materials science for high technologies : MASHTEC '90 : proceedings of the International Symposium held in Dresden, German Democtatic Republic April 24-27, 1990. Pt.1 pp.63-64, 1990. Aedermannnsdorf, Switzerland. Trans Tech Publications
Materials science for high technologies : MASHTEC '90 : proceedings of the International Symposium held in Dresden, German Democtatic Republic April 24-27, 1990. Pt.1 pp.67-68, 1990. Aedermannnsdorf, Switzerland. Trans Tech Publications
Texture and anisotropy of polycrystals : Proceedings of the International Conference on Texture and Anisotropy of Polycrystals, ITAP, Clausthal, Germany, September 22-25, 1997. pp.567-572, 1998. Zuerich, Switzerland. Trans Tech Publications