Optical design and testing II : 8-12 November 2004, Beijing, China. pp.758-765, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium. pp.110-121, 2000. Pennington, N.J.. Electrochemical Society
Optical design and testing II : 8-12 November 2004, Beijing, China. pp.961-966, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Woo, W. ; Feng, Z. ; Wang, X.L. ; An, K. ; Bailey, W.B. ; David, S.A. ; Hubbard, C.R. ; Choo, H.
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Residual stresses VII : ECRS 7 : proceedings of the 7th European conference on residual stresses, Berlin, Germany, 13-15 September 2006. pp.387-392, 2006. Switzerland. Trans Tech Publications
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High-Temperature ordered intermetallic alloys VI : symposium held November 28-December 1, 1994, Boston, Massachusetts, U.S.A.. pp.109-, 1995. Pittsburgh, Pa.. MRS - Materials Research Society
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Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China. pp.165-173, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering