1.

国際会議録
国際会議録
1. Capture kinetics of the individual DX center levels
Su,Z. ; Farmer,J.W.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.817-822,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
2.

国際会議録
国際会議録
2. Neutron Transmutation Doping of Isotopically Controlled Ge
Itoh,K. ; Hansen,W.L. ; Haller,E.E. ; Farmer,J.W. ; Ozhogin,V.I.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.117-122,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118
3.

国際会議録
国際会議録
3. Ionized impurity scattering in isotopically engineered,compensated Ge:Ga,As
Itoh,K.M. ; Kinoshita,T. ; Walukiewicz,W. ; Beeman,J.W. ; Haller,E.E. ; Muto,J. ; Farmer,J.W. ; Ozhogin,V.I.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.77-82,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
4.

国際会議録
国際会議録
4. Electric Field Broadening of Gallium Acceptor States in Compensated Ge:Ga,As
Itoh,K.M. ; Walukiewicz,W. ; Beeman,J.W. ; Haller,E.E. ; Kim,H.-J. ; Mayur,A.J. ; Sciacca,M.D. ; Ramdas,A.K. ; Buczko,R. ; Farmer,J.W. ; Ozhogin,V.I.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.127-132,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201