1.

国際会議録
国際会議録
1. Gettering of copper and iron to extended surface defects in silicon
Coteau,M.D.de ; Wilshaw,P.R. ; Falster,R.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.185-190,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
2.

国際会議録
国際会議録
2. Vacancy-Nitrogen Complexes in Float-Zone Silicon
Quast,F. ; Pichler,P. ; Ryssel,H. ; Falster,R.
出版情報: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.156-163,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4218
3.

国際会議録
国際会議録
3. Gate oxide Integrity Response as a Function of Near the Surface Crystal Defects Morphology
Borionetti,G. ; Godio,P. ; Bonoli,F. ; Cornara,M. ; Orizio,R. ; Falster,R.
出版情報: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.456-466,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4218
4.

国際会議録
国際会議録
4. Shailow thermal donors in annealed CZ silicon and links to the NL1O EPR spectrum:the reievance of H,Al and N imporities
Newman,R.C. ; Ashwin,M.J. ; Pritcbard,R.E ; Tucker,J.H. ; Lightowlers,E.C. ; Gregorkiewicz,T. ; Zevenbergen,I.S. ; Ammeriaan,C.A.J. ; Falster,R. ; Binns,M.J.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.379-384,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
5.

国際会議録
国際会議録
5. An investigation of the possibility that oxygen diffusion in Czechralski silicon is catalyzed during clustering.(Invited)
McQuaid,S.A. ; Johason,B.K. ; Falster,R. ; Kelton,K.F.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.347-354,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
6.

国際会議録
国際会議録
6. Vibrational absorption from oxygen-hydrogen(Oi-H2)complexes in hydrogeBated CZ silicon
Pritchard,R.E. ; Ashwin,M.J. ; Newman,R.C. ; Tucker,J.H. ; Lightowlers,E.C. ; Binns,M.J. ; Falster,R. ; McQuaid,S.A.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.283-288,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263