Physics and simulation of optoelectronic devices VII : 25-29 January 1999, San Jose, USA. pp.579-587, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California. pp.144-153, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA. Part1 pp.330-334, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
In-plane semiconductor lasers III : 27-29 January 1999, San Jose, California. pp.88-94, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
In-Plane Semiconductor Lasers: from Ultraviolet to Midinfrared. pp.264-270, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
In-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II. pp.212-223, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
In-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II. pp.231-236, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering