1.

国際会議録
国際会議録
1. Calculation of third-order optical susceptibilities due to excitonic nonlinearities in rectangular GaAs/AlGaAs quantum well wires with finite Al-graded band offsets included
F.L. Madarasz ; F. Szmulowicz ; F.K. Hopkins
出版情報: Optoelectronic integrated circuit materials, physics, and devices : 6-9 February 1995, San Jose, California.  pp.134-147,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2397
2.

国際会議録
国際会議録
2. Modeling of normal incidence absorption in p-type GaAs/AlGaAs quantum well infrared detectors
G.J. Brown ; F. Szmulowicz
出版情報: Optoelectronic integrated circuit materials, physics, and devices : 6-9 February 1995, San Jose, California.  pp.461-475,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2397
3.

国際会議録
国際会議録
3. Multilayered photonic crystals de novo: new formalism, results, insights, and analytic possibilities
F. Szmulowicz
出版情報: Photonic crystal materials and devices VI : 22-25 January 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6480
4.

国際会議録
国際会議録
4. Proposal for (110) InAs/GaSb superlattices for infrared detection
F. Szmulowicz ; H. J. Haugan ; G. J. Brown
出版情報: Quantum sensing and nanophotonic devices V : 20-23 January 2008, San Jose, California, USA.  pp.69000L-1-69000L-10,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6900
5.

国際会議録
国際会議録
5. Interface roughness estimate from carrier transport in InAs/GaSb superlattices
F. Szmulowicz ; S. Elhamri ; H. J. Haugan ; G. J. Brown ; W. C. Mitchel
出版情報: Quantum sensing and nanophotonic devices V : 20-23 January 2008, San Jose, California, USA.  pp.69000P-1-69000P-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6900