1.

国際会議録
国際会議録
1. Characterization of the monochromatic laser Compton x-ray beam with picosecond and femtosecond pulse widths
Endo,A. ; Takasago,K. ; Ito,S. ; Yang,J. ; Yanagida,T. ; Okada,Y. ; Yorozu,M. ; Sakai,F.
出版情報: Advances in laboratory-based X-ray sources and optics II : 30 July-1 August 2001, San Diego, USA.  pp.100-108,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4502
2.

国際会議録
国際会議録
2. Advance of resist profile control in multilayer resist process for sub-150-nm lithography
Kimura,Y. ; Endo,H. ; Endo,A.
出版情報: Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California.  Part 1  pp.347-356,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3333
3.

国際会議録
国際会議録
3. Detection of hydrogen isotope atoms by mass spectrometry combined with resonant ionization
Okada,Y. ; Yorozu,M. ; Endo,A.
出版情報: Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany.  pp.143-148,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3824
4.

国際会議録
国際会議録
4. Measurement of depth profile of hydrogen isotope atom contained in solid material using resonant laser ablation
Yorozu,M. ; Okada,Y. ; Nakajyo,T. ; Endo,A.
出版情報: Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany.  pp.149-154,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3824
5.

国際会議録
国際会議録
5. Laser synchrotron femtosecond x-ray source for novel imaging
Endo,A. ; Kobayashi,K. ; Takasago,K. ; Ito,S. ; Yang,J. ; Okada,Y. ; Yorozu,M. ; Sakai,F. ; Aoki,Y.
出版情報: Advances in laboratory-based X-ray sources and optics : 31 July-1 August 2000, San Diego, USA.  pp.16-25,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4144
6.

国際会議録
国際会議録
6. Temperature measurement by laser-induced fluorescence of nitric oxide in combustion flame
Yorozu,M. ; Okada,Y. ; Endo,A.
出版情報: Combustion diagnostics : 17 June 1997, Munich, FRG.  pp.80-86,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3108
7.

国際会議録
国際会議録
7. Optically phase-locked femtosecond laser oscillator for precise synchronization with femtosecond x-ray beams
Endo,A. ; Nagaoka,H. ; Miura,T. ; Takasago,K. ; Torizuka,K.
出版情報: Optics for fourth-generation x-ray sources : 1-2 August 2001, San Diego, USA.  pp.162-167,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4500
8.

国際会議録
国際会議録
8. Development of a compact lidar system using OPO
Okada,Y. ; Yorozu,M. ; Endo,A.
出版情報: Lidar atmospheric monitoring : 16-18 June 1997, Munich, FRG.  pp.257-264,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3104
9.

テクニカルペーパー
テクニカルペーパー
9. Producing Electric Power by Wet Oxidation of Biomass Ethanol
Naito,K. ; Huang,K. ; Endo,A. ; Nakaiwa,M. ; Akiya,T. ; Nakane,T.
出版情報: A collection of technical papers : 35th intersociety energy conversion engineering conference & exhibit (IECEC), Las Vegas, Nevada, 24 July - 28 July 2000.  v. 1  pp.345-348,  2000.  [Reston, VA].  American Institute of Aeronautics and Astronautics
シリーズ名: AIAA Paper : Intersociety Energy Conversion Engineering Conference and Exhibit (IECEC)
シリーズ巻号: 2000
10.

国際会議録
国際会議録
10. Hierarchical proximity correction using CAPROX
Hofmann,U. ; Kalus,C.K. ; Rosenbusch,A. ; Endo,H. ; Kimura,Y. ; Endo,A.
出版情報: 15th Annual BACUS Symposium on Photomask Technology and Management.  pp.558-567,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2621