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Infuence of Hydrostatic Pressure on Deep Levels in Silicon Induced by Annealing

著者名:
Smid,V.
Zeman,J.
Kristorik,J.
Mares,J.J.
Vyzhigin,Yu.V.
Kostylev,V.A.
Sobolev,N.A.
Eliseev,V.V.
Likunova,V.M.
さらに 4 件
掲載資料名:
Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988
シリーズ名:
Materials science forum
シリーズ巻号:
38-41
発行年:
1989
巻:
Part1
開始ページ:
231
終了ページ:
236
出版情報:
Aederlmannsdorf, Switzwelns: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495849 [0878495843]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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