1.

国際会議録
国際会議録
1. Optical Characterization of Full SiC Wafer
El Harrouni, I. ; Bluet, J.M. ; Ziane, D. ; Mermoux, M. ; Baillet, F. ; Guillot, G.
出版情報: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.593-596,  2004.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 457-460
2.

国際会議録
国際会議録
2. Application of UV Scanning Photoluminescence Spectroscopy for Minority Carrier Lifetime Mapping
Masarotto, L. ; Bluet, J.M. ; El Harrouni, I. ; Guillot, G.
出版情報: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.349-352,  2003.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 433-436
3.

国際会議録
国際会議録
3. Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman Spectroscopy Imaging and Photoluminescence Spectroscopy Imaging
Pernot, E. ; El Harrouni, I. ; Mermoux, M. ; Bluet, J.M. ; Anikin, M. ; Chaussende, D. ; Pons, M. ; Madar, R.
出版情報: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.265-268,  2003.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 433-436