1.

国際会議録
国際会議録
1. Gain fixed-pattern-noise correction via optical flow
Lim, S. ; El Gamal, A.
出版情報: Sensors and camera systems for scientific, industrial, and digital photography applications III : 21-23 January, 2002, San Jose, [California], USA.  pp.384-391,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4669
2.

国際会議録
国際会議録
2. Photocurrent estimation for a self-reset CMOS image sensor
Liu, X. ; El Gamal, A.
出版情報: Sensors and camera systems for scientific, industrial, and digital photography applications III : 21-23 January, 2002, San Jose, [California], USA.  pp.304-312,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4669
3.

国際会議録
国際会議録
3. Optimal scheduling of capture times in a multiple-capture imaging system
Chen, T. ; El Gamal, A.
出版情報: Sensors and camera systems for scientific, industrial, and digital photography applications III : 21-23 January, 2002, San Jose, [California], USA.  pp.288-296,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4669
4.

国際会議録
国際会議録
4. Quantitative study of high dynamic range Sigma-Delta-based focal plane array architectures
Kavusi, S. ; Kakavand, H. ; El Gamal, A.
出版情報: Infrared Technology and Applications XXX.  pp.341-350,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5406
5.

国際会議録
国際会議録
5. Folded multiple-capture: an architecture for high dynamic range disturbance-tolerant focal plane array
Kavusi, S. ; El Gamal, A.
出版情報: Infrared Technology and Applications XXX.  pp.351-360,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5406