1.

国際会議録
国際会議録
1. Non-Destructive Lifetime Prediction in Material Testing with the Bonn Positron Microprobe
Mueller, I. ; Bennewitz, K. ; Haaks, M. ; Staab, T.E.M. ; Eisenberg, S. ; Lampe, T. ; Maier, K.
出版情報: Positron annihilation ICPA-13 : proceedings of the 13th International Conference on Positron Annihilation, Kyoto, Japan, September 2003.  pp.498-500,  2004.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 445-446
2.

テクニカルペーパー
テクニカルペーパー
2. Reliability Testing and Damage Analysis of Lead-Free Solder Joints: New Assessment Criteria for Laboratory Methods.
Steller, A. ; Zimmermann, A. ; Eisenberg, S. ; Wolter, K-J. ; Lange, P.
出版情報: 2009 SAE world congress : technical paper.  2009.  Warrendale, Penn..  Society of Automotive Engineers
シリーズ名: Society of Automotive Engineers technical paper series
シリーズ巻号: 2009
3.

国際会議録
国際会議録
3. Visualization and PIV measurements of high-speed flows and other phenomena with novel ultrahigh-speed CCD camera
Eisenberg, S. ; Reckers, W. ; Wieneke, B.
出版情報: 25th International Congress on High-Speed Photography and Photonics.  pp.671-676,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4948