1.

国際会議録
国際会議録
1. Infrared spectroscopic ellipsometry for nondestructive characterization of free-carrier and crystal-structure properties of group-？-nitride semiconductor device heterostructures
Schubert,M. ; Kasic,A. ; Figge,S. ; Diesselberg,M. ; Einfeldt,S. ; Hommel,D. ; Kohler,U. ; As,D.J. ; Off,J. ; Kuhn,B. ; Scholz,F. ; Woollam,J.A. ; Herzinger,C.M.
出版情報: Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August 2001 San Diego, USA.  pp.58-68,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4449
2.

国際会議録
国際会議録
2. Absorption as Optical Access to Acceptor Concentratious and Compensation Mechanisms in ZnSe Epilayers
Heitz,R. ; Lummer,B. ; Kutzer,V. ; Wiesmann,D. ; Hoffmann,A. ; Broser,I. ; Kurtz,E. ; Einfeldt,S. ; Nurmberger,J. ; Jobst,B. ; Hommel,D. ; Landwehr,G.
出版情報: II-VI compounds and semimagnetic semiconductors : joint proceedings of the Third European Workshop on II-VI Compounds, Linz, Austria, 26-28 September 1994, and the Fourth International Workshop on Semimagnetic (Diluted Magnetic) Semiconductors, Linz, Austria, 26-28 September 1994.  pp.259-262,  1995.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 182-184
3.

国際会議録
国際会議録
3. Optical Admittance Spectroscopy of Deep Centers in Galliunrnitride-Correlation with Photoluminescence
Krtschil,A. ; Fischer,P. ; Witte,H. ; Lisker,M. ; Christen,J. ; Birkle,U. ; Einfeldt,S. ; Hommel,D.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1381-1384,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268