1.

国際会議録
国際会議録
1. Design and development of high-performance radiation-hardened antireflection coatings for LWIR HgCdTe focal plane arrays
Sood, A. K. ; Egerton, E. J. ; Bhadra, S. K. ; Puri, Y. R. ; Brill, G. ; Wijewarnasuriya, P. S. ; Chan, Y. ; Dhar, N. K. ; Tidrow, M. Z. ; Christian, D. ; LoVecchio, P.
出版情報: Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA.  pp.15-26,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5564
2.

国際会議録
国際会議録
2. Design and development of multicolor detector arrays
Sood, A. K. ; Egerton, E. J. ; Puri, Y. R. ; Bellotti, E. ; Becker, L. S. R. ; Sivananthan, S.
出版情報: Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA.  pp.27-33,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5564
3.

国際会議録
国際会議録
3. Design and development of high quantum efficiency large area UV focal plane arrays for photon counting applications [6389-27]
Egerton, E. J. ; Sood, A. K. ; Bell, R. A. ; Puri, Y. R. ; Roginsky, J. ; Ulmer, M. P. ; Wessels, B. W. ; Cook, T.
出版情報: Active and passive optical components for communications VI : 3-4 October, 2006, Boston, Massachusetts, USA.  pp.63890R-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6389
4.

国際会議録
国際会議録
4. Development of high-performance AlGaN/GaN high-electron mobility transistors for RF applications
Sood, A. K. ; Egerton, E. J. ; Puri, Y. R. ; Clarke, F. W. Jr. ; Hwang, J. C. M. ; Dabiran, A. ; Chow, P. ; Anderson, T. ; Gupta, A. ; Souzis, A.
出版情報: Free-space laser communications IV : 2-4 August 2004, Denver, Colorado, USA.  pp.130-144,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5550