1.

国際会議録
国際会議録
1. Nanoindentation Of Silicate Low-K Dielectric Thin Films
Vella, Joseph B. ; Volinsky, Alex A. ; Adhihetty, Indira S. ; Edwards, N.V. ; Gerberich, William W.
出版情報: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.619-626,  2002.  Warrendale.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 716
2.

国際会議録
国際会議録
2. Characterization of High-k Dielectric Films with Tunneling AFM
Wang, Xiang-Dong ; Kulik, Joe ; Edwards, N.V. ; Samavedam, S.B. ; Lu, Shifeng
出版情報: Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.183-376,  2003.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 738
3.

国際会議録
国際会議録
3. Spectroscopic Ellipsometry as a Potential In-Line Optical Metrology Tool For Relative Porosity Measurements of Low- K Dielectric Films
Edwards, N.V. ; Vella, J. ; Xie, Q. ; Zollner, S. ; Werho, D. ; Adhihetty, I. ; Liu, R. ; Tiwald, T.E. ; Russell, C. ; Vires, J. ; Junker, K.H.
出版情報: Surface engineering 2001 - fundamentals and applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A..  pp.101-106,  2002.  Warrendale, Penn.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 697
4.

国際会議録
国際会議録
4. Determination and Critical Assessment of the Optical Properties of Common Substrate Materials Used in III-V Nitride Heterostructures with Vacuum Ultraviolet Spectroscopic Ellipsometry
Edwards, N.V. ; Lindquist, O.P.A. ; Madsen, L.D. ; Zollner, S. ; Jarrehdahl, K. ; Cobet, C. ; Peters, S. ; Esser, N. ; Konkar, A. ; Aspnes, D.E.
出版情報: GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A..  pp.509-514,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 693
5.

国際会議録
国際会議録
5. Residual Stress and Microstructure of Electroplated Cu Film on Different Barrier Layers
Volinsky, Alex A. ; Hauschildt, Meike ; Vella, Joseph B. ; Edwards, N.V. ; Gregory, Rich ; Gerberich, William W.
出版情報: Thin films : stresses and mechanical properties IX : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A..  pp.27-34,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 695
6.

国際会議録
国際会議録
6. Optical Vibrational and Structural Properties of Ge1-xSnx Alloys by UHV-CVD
Taraci, Jennifer ; Zollner, S. ; McCartney, M.R. ; Menendez, Jose ; Smith, D.J. ; Tolle, John ; Bauer, M. ; Duda, Erika ; Edwards, N.V. ; Kouvetakis, J.
出版情報: Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.  pp.631-636,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 692
7.

国際会議録
国際会議録
7. Photo-Assisted MOVPE Growth of ZnMgS on (100) Si
Rodriguez, Angel ; Shattuck, Jeremy ; Zhang, Ziaoguang ; Smith, D.J. ; Tolle, John ; Bauer, M. ; Duda, Erika ; Edwards, N.V. ; Kouvetakis, J.
出版情報: Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.  pp.625-630,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 692
8.

国際会議録
国際会議録
8. Ordinary and Extra-Ordinary Dielectric Function of 4H- and 6H-SiC in the 0.7 to 9.0 eV Photon Energy Range
Limdquist, O.P.A. ; Jaerrendahl, K. ; Arwin, H. ; Peters, S. ; Zettler, J.-T. ; Cobet, C. ; Esser, N. ; Aspnes, D.E. ; Henry, A. ; Edwards, N.V.
出版情報: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 640
9.

国際会議録
国際会議録
9. Mechanical Properties and Porosity of Organo-silicate Glass (OSG) Low-k Dielectric Films
Vella, J.B. ; Xie, Q. ; Edwards, N.V. ; Kulik, J. ; Junker, K.H.
出版情報: Thin films : stresses and mechanical properties IX : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A..  pp.309-316,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 695
10.

国際会議録
国際会議録
10. Growth and Doping of AlxGa1-xN Deposited Directly on α(6H)-SiC(0001) Substrates Via Organometallic Vapor Phase Epitaxy
Bremser, M.D. ; Perry, W.G. ; Edwards, N.V. ; Zheleva, T. ; Parikh, N. ; Aspnes, D.E. ; Davis, R.F.
出版情報: Proceedings of the Thirteenth International Symposium on Chemical Vapor Deposition.  pp.402-407,  1996.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 96-5