1.

国際会議録
国際会議録
1. Analysis of Strain in GaN on Al2O3 and 6H-SiC: Near-Bandedge Phenomena
Edwards, N. V. ; Bremser, M. D. ; Weeks, T. W., Jr. ; Kern, R. S. ; Liu, H. ; Stall, R. A. ; Wickenden, A. E. ; Doverspike, K. ; Gaskill, D. K. ; Freitas, J. A., Jr. ; Rossow, U. ; Davis, R. F. ; Aspnes, D. E.
出版情報: Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.405-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 395
2.

国際会議録
国際会議録
2. Photoluminescence study of energy transfer processes in erbium doped AlxGa1-xas grown by MBE
Zhang, Tong ; Sun, J. ; Edwards, N. V. ; Moxey, D. E. ; Kolbas, R. M. ; Caldwell, P. J.
出版情報: Rare earth doped semiconductors : symposium held April 13-15, 1993, San Francisco, California, U.S.A..  pp.257-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 301
3.

国際会議録
国際会議録
3. Relaxation Phenomena in GaN/AlN/6H-SiC Heterostructures
Edwards, N. V. ; Batchelor, A. D. ; Buyanova, I. A. ; Madsen, L. D. ; Bremser, M. D. ; Davis, R. F. ; Aspnes, D. E. ; Monemar, B.
出版情報: GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A..  pp.G3.78.1-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 537
4.

国際会議録
国際会議録
4. Real-Time Assessment of Overlayer Removal on 4H-SiC Surfaces: Techniques and Relevance to Contact Formation
Edwards, N. V. ; Madsen, L. D. ; Robbie, K. ; Powell, G. D. ; Jarrendahl, K. ; Cobet, C. ; Esser, N. ; Richter, W. ; Aspnes, D. E.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1033-1036,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(2)
5.

国際会議録
国際会議録
5. Growth and Doping of AlxGa1-xN Deposited Directly on α(6H)-SiC(0001) Substrates Viia Organometallic Vapor Phase Epitaxy
Bremser, M. D. ; Perry, W. G. ; Edwards, N. V. ; Zheleva, T. ; Parikh, N. ; Aspnes, D. E. ; Davis, R. F.
出版情報: Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.195-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 395
6.

国際会議録
国際会議録
6. Variation of GaN Valence Bands with Biaxial Stress: Quantification of Residual Stress and Impact on Fundamental Band Parameters
Edwards, N. V. ; Yoo, S. D. ; Bremser, M. D. ; Horton, M. N. ; Perkins, N. R. ; Weeks, T. W., Jr. ; Liu, H. ; Stall, R. A. ; Kuech, T. F. ; Davis, R. F. ; Aspnes, D. E.
出版情報: III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.781-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 449
7.

国際会議録
国際会議録
7. In-Plane Optical Anisotropies of AlxGa1-xN Films in Their Regions of Transparency
Rossow, U. ; Edwards, N. V. ; Bremser, M. D. ; Kern, R. S. ; Liu, H. ; Davis, R. F. ; Aspnes, D. E.
出版情報: III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.835-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 449
8.

国際会議録
国際会議録
8. EUV testing of multilayer mirrors: critical issues [6151-15]
Hill, S. B. ; Ermanoski, I. ; Grantham, S. ; Tarrio, C. ; Lucatorto, T. B. ; Madey, T. E. ; Bajt, S. ; Chandhok, M. ; Yan, P. ; Wood, O. ; Wurm, S. ; Edwards, N. V.
出版情報: Emerging Lithographic Technologies X.  pp.61510F-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6151