1.

国際会議録
国際会議録
1. High-resolution extended NIR camera
Cabelli, S.A. ; Pan, J. ; Bernd, S.G. ; Tennant, W.E. ; Blackwell, J.D. ; Bhargava, S. ; Pasko, J.G. ; Piquette, E.C. ; Edwall, D.D.
出版情報: Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA.  pp.343-352,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5074
2.

国際会議録
国際会議録
2. Characterization of Rockwell Scientific LWIR HgCdTe detector arrays
Bacon, C.M. ; McMurtry, C.W. ; Pipher, J.L. ; Forrest, W.J. ; Garnett, J.D. ; Lee, D.-G. ; Edwall, D.D.
出版情報: Focal plane arrays for space telescopes : 4-6 August 2003, San Diego, California, USA.  pp.313-319,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5167
3.

国際会議録
国際会議録
3. Device analysis of MBE HgCdTe p-on-n photovoltaic detectors in 5- to 15-μm wavelength range
Wijewarnasuriya, P.S. ; Dhar, N.K. ; D'Souza, A.I. ; Stapelbroek, M.G. ; Edwall, D.D. ; Arias, J.M. ; Bajaj, J.
出版情報: Infrared Technology and Applications XXX.  pp.230-238,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5406