1.

国際会議録
国際会議録
1. NON-CONTACT, WAFER-SCALE DEEP LEVEL TRANSIENT SPECTROS COPY (DLTS) BASED ON SURFACE PHOTOVOLTAGE (SPV)
Lagowski, Jacek ; Morawski, Adrzej ; Edelman, Piotr
出版情報: Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.129-134,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 240
2.

国際会議録
国際会議録
2. Non-Contact Mapping of Fe Contamination in Oxidized Si Wafers With Sensitivity in Part-Per-Trillion Range
Lagowski, Jacek ; Edelman, Piotr
出版情報: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.449-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 428
3.

国際会議録
国際会議録
3. POROUS SILICON LUMINESCENCE STUDY BY IMAGING METHODS: RELATIONSHIP TO PORE DIMENSIONS
Kontkiewicz, Anna ; Kontkiewicz, Andrzej M. ; Sen, Sidhartha ; Wesolowski, Marek ; Lagowski, Jacek ; Edelman, Piotr ; Kowalewski, Tomasz
出版情報: Determining nanoscale physical properties of materials by microscopy and spectroscopy.  pp.201-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 332
4.

国際会議録
国際会議録
4. CONTAMINATION MONITORING USING SURFACE PHOTOVOLTAGE AND APPLICATION TO PROCESS LINE CONTROL
Jastrzebski, Lubek ; Lagowski, Jacek ; Henley, Worth ; Edelman, Piotr
出版情報: Beam-solid interactions for materials synthesis and characterization : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.405-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 354