Study on the Microstructure and Electrical Properties of Pb(Zr0.53Ti0.47)O3 Thin-Films
- 著者名:
- 掲載資料名:
- Advanced electron microscopy and nanomaterials : selected, peer reviewed papers from the First Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT '09), Saltillo (Coahuila) Mexico, September 29th-October 2nd, 2009
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 644
- 発行年:
- 2010
- 開始ページ:
- 97
- 終了ページ:
- 100
- 総ページ数:
- 4
- 出版情報:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
8
国際会議録
Densification and evolution of stress development in solution derived PbZr0.53Ti0.47O3 thin layers
MRS-Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
MRS - Materials Research Society |
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications | |
Materials Research Society |
Society of Photo-optical Instrumentation Engineers |