1.

国際会議録
国際会議録
1. X-ray study of surfaces and interfaces
Asadchikov,V.E. ; Bukreeva,I.N. ; Duparre,A. ; Kozhevnikov,I.V. ; Krivonosov,Yu.S. ; Morawe,C. ; Pyatakhin,M.V. ; Steinert,J. ; Vinogradov,A.V. ; Ziegler,E.
出版情報: Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August 2001 San Diego, USA.  pp.253-264,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4449
2.

国際会議録
国際会議録
2. Surface finish and optical quality of CaF2 for UV lithography applications
Duparre,A. ; Thielsch,R. ; Kaiser,N. ; Jakobs,S. ; Mann,K.R. ; Eva,E.
出版情報: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.1048-1054,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3334
3.

国際会議録
国際会議録
3. Noncontact testing of optical surfaces by multiple-wavelength light scattering measurement
Duparre,A. ; Gliech,S.
出版情報: 10th Meeting on Optical Engineering in Israel, 2-6 March 1997, Jerusalem, Israel.  Part 2  pp.566-573,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3110
4.

国際会議録
国際会議録
4. Laser damage threshold of MgF2 thin films by photoacoustic beam deflection
Protopapa,M.L. ; Perrone,M.R. ; Piegari,A.M. ; Masetti,E. ; Ristau,D. ; Quesnel,E. ; Duparre,A.
出版情報: Laser-induced damage in optical materials, 1999 : 31th Annual Boulder Damage Symposium, proceedings, 4-7, October, 1999, Boulder, Colorado.  pp.175-181,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3902
5.

国際会議録
国際会議録
5. UV-optical and microstructural properties of MgF2 coatings deposited by IBS and PVD processes
Ristau,D. ; Arens,W. ; Bosch,S. ; Duparre,A. ; Masetti,E. ; Jacob,D. ; Kiriakidis,G. ; Peiro,F. ; Quesnel,E. ; Tikhonravov,A.V.
出版情報: Advances in Optical Interference Coatings : 25-27 May 1999, Berlin, Germany.  pp.436-445,  1999.  Bellingham, WA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3738
6.

国際会議録
国際会議録
6. SLIOS:a contribution to standard procedures in stray light measurements
Baumer,S.M.B. ; Duparre,A. ; Herrmann,T. ; Schumann,U. ; Smorenburg,C. ; Kirschner,V. ; Mattsson,L.H. ; Quinteros,T. ; Berglind,R. ; Schippel,S.
出版情報: Optical fabrication and testing : 26-28 May 1999, Berlin, Germany.  pp.414-421,  1999.  Bellingham, WA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3739
7.

国際会議録
国際会議録
7. International round-robin experiment on optical total scattering at 633 nm according to ISO/DIS 13696
Kadkhoda,P. ; Amra,C. ; Bennett,J.M. ; Deumie,C. ; Duparre,A. ; Gliech,S. ; Jolie,C. ; Kessler,H. ; Lauth,H. ; Lindstroem,T. ; Muller,A. ; Reng,N. ; Ribbing,C.G. ; Ristau,D. ; Schuhmann,U. ; Tilsch,M.
出版情報: Optical fabrication and testing : 26-28 May 1999, Berlin, Germany.  pp.548-556,  1999.  Bellingham, WA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3739
8.

国際会議録
国際会議録
8. DUV light scattering and morphology of ion-beam-sputtered fluoride coatings
Quesnel,E. ; Dariel,A.Petit dit ; Duparre,A. ; Ferre-Borrull,J. ; Steinert,J.
出版情報: Advances in Optical Interference Coatings : 25-27 May 1999, Berlin, Germany.  pp.410-416,  1999.  Bellingham, WA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3738
9.

国際会議録
国際会議録
9. New procedure for the optical characterization of high-quality thin films
Bosch,S. ; Leinfellner,N. ; Quesnel,E. ; Duparre,A. ; Ferre-Borrull,J. ; Gunster,S. ; Ristau,D.
出版情報: Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA.  pp.124-130,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4099
10.

国際会議録
国際会議録
10. Properties of fluoride DUV excimer laser optics:influence of the number of dielectric layers
Arens,W. ; Ristau,D. ; Ullmann,J. ; Zaczek,C. ; Thielsch,R. ; Kaiser,N. ; Duparre,A. ; Apel,O. ; Mann,K.R. ; Lauth,H. ; Bernitzki,H. ; Ebert,J. ; Schippel,St. ; Heyer,H.
出版情報: Laser-induced damage in optical materials, 1999 : 31th Annual Boulder Damage Symposium, proceedings, 4-7, October, 1999, Boulder, Colorado.  pp.250-259,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3902