Yin, -C. G. ; Duewer, F. ; Zeng, X. ; Lyon, A. ; Yun, W. ; Chen, -R. F. ; Liang, S. K.
出版情報:
Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA. pp.631703-631703, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Tkachuk, A. ; Feser, M. ; Cui, H. ; Duewer, F. ; Chang, H. ; Yun, W.
出版情報:
Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA. pp.63181D-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, S. ; Duewer, F. ; Feser, M. ; Scott, D. ; Yun, W.
出版情報:
Testing, Reliability, and Application of Micro- and Nano-Material Systems III. pp.40-48, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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