1.

国際会議録
国際会議録
1. Effects of Structural Defects on Diode Properties in 4H-SiC
Skromme, B.J. ; Palle, K.C. ; Mikhov, M.K. ; Meidia, H. ; Mahajan, S. ; Huang, X.R. ; Vetter, W.M. ; Dudley, M. ; Moore, K. ; Smith, S. ; Gehoski, T.
出版情報: Silicon carbide 2002 -- materials, processing and devices : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A..  pp.181-186,  2003.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 742
2.

国際会議録
国際会議録
2. Structural Characterization of SiC Epitaxial Layers Grown on Porous SiC Substrates
Saddow, S.E. ; Melnychuk, G. ; Mynbaeva, M. ; Nikitina, I. ; Vetter, W.M. ; Jin, L. ; Dudley, M. ; Shamsuzzoha, M. ; Dmitriev, V. ; Wood, C.E.C
出版情報: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 640
3.

国際会議録
国際会議録
3. The Effect of Surface Finish on the Dislocation Density in Sublimation Grown SiC Layers
Sanchez, E. K. ; Liu, J. ; Skowronski, M. ; Vetter, W. M. ; Dudley, M. ; Bertke, R. ; Mitchel, W.C.
出版情報: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 640
4.

国際会議録
国際会議録
4. Structural Investigation on the Nature of Surface Defects Present in Silicon Carbide Wafers Containing Varying Amount of Micropipes
Shamsuzzoha, M. ; Saddow, S. E. ; Schattner, T. E. ; Jin, L. ; Dudley, M. ; Rendakova, S. V. ; Dmitriev, V. A.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.453-456,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
5.

国際会議録
国際会議録
5. X-Ray Characterization of 3 Inch Diameter 4H and 6H-SiC Experimental Wafers
Kuhr, T. A. ; Vetter, W. M. ; Dudley, M. ; Skowronski, M.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.473-476,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
6.

国際会議録
国際会議録
6. Synchrotron White Beam X-Ray Topography and Atomic Force Microscopy Studies of a 540R-SiC Lely Platelet
Vetter, W. M. ; Dudley, M. ; Huang, W. ; Neudeck, P. ; Powell, J. A.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.469-472,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
7.

国際会議録
国際会議録
7. Correlation of EBIC and SWBXT Imaged Defects and Epilayer Growth Pits in 6H-SiC Schottky Diodes
Schnabel, C. M. ; Tabib-Azar, M. ; Neudeck, P. G. ; Bailey, S. G. ; Su, H. B. ; Dudley, M. ; Raffaelle, R. P.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.489-492,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
8.

国際会議録
国際会議録
8. Synchrotron White Beam Topography Studies of 2H SiC Crystals
Dudley, M. ; Huang, W. ; Vetter, W. M. ; Neudeck, P. ; Powell, J. A.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.465-468,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
9.

国際会議録
国際会議録
9. Progress In The Preparation Of Aluminum Nitride Substrates From Bulk Crystals
Rojo, J.C. ; Schowalter, L.J. ; Slack, Glen ; Morgan, K. ; Barani, J. ; Schujman, S. ; Biswas, S. ; Raghothamachar, B. ; Dudley, M. ; Shur, M. ; Gaska, R. ; Johnson, N.M. ; Kneissl, M.
出版情報: Materials and devices for optoelectronics and microphotonics : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.5-14,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 722
10.

国際会議録
国際会議録
10. Relationship of Basal Plane and Prismatic Stacking Faults in GaN to Low Temperature Photoluminescence Peaks at 〜3.4 eV and 〜3.2 eV
Bai, J. ; Dudley, M. ; Chen, L. ; Skromme, B. J. ; Hartlieb, P. J. ; Michaels, E. ; Kolis, J. W. ; Wagner, B. ; Davis, R. F. ; Chowdhury, U. ; Dupuis, R. D.
出版情報: GaN, AIN, InN and their alloys : symposium held November 29-December 3, 2004, Boston, Massachusetts, U.S.A..  pp.721-726,  2005.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 831