1.

国際会議録
国際会議録
1. Optical diagnostics for the pulsed laser deposition of YBa2Cu3O7-x superconducting wires
Druffner, C.J. ; Kee, P.D. ; Lange, M.A. ; Perram, G.P. ; Biggers, R.R. ; Barnes, P.N.
出版情報: High-Power Laser Ablation V.  pp.153-164,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5448
2.

国際会議録
国際会議録
2. High-resolution nondestructive evaluation at the Center for Materials Diagnosis
Meyendorf, N. ; Sathish, S. ; Druffner, C.J. ; Blackshire, J.L. ; Hoffmann, J.P. ; Zhan, Q. ; Andrews, R.J.
出版情報: Testing, Reliability, and Application of Micro-and Nano-Material Systems II.  pp.256-265,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5392
3.

国際会議録
国際会議録
3. Improving atomic force microscopy images with the adaptation of ultrasonic force microscopy
Druffner, C.J. ; Sathish, S.
出版情報: Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems.  pp.105-113,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4703
4.

国際会議録
国際会議録
4. Imaging the microstructure of copper with the atomic force microscope (AFM) and ultrasonic force microscope (UFM)
Druffner, C.J. ; Schumaker, E.J. ; Murray, P.T. ; Sathish, S.
出版情報: Testing, Reliability, and Application of Micro-and Nano-Material Systems.  pp.122-131,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5045