Infrared imaging systems : design, analysis, modeling, and testing XII : 18-19 April 2001, Orlando, USA. pp.51-61, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Infrared imaging systems : design, analysis, modeling, and testing XII : 18-19 April 2001, Orlando, USA. pp.74-84, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Infrared imaging systems : design, analysis, modeling, and testing XII : 18-19 April 2001, Orlando, USA. pp.162-169, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Infrared imaging systems : design, analysis, modeling, and testing XII : 18-19 April 2001, Orlando, USA. pp.182-193, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA. pp.1-13, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida. pp.138-156, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Infrared imaging systems : design, analysis, modeling, and testing IX : 15-16 April 1998, Orlando, USA. pp.2-10, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Infrared imaging systems : design, analysis, modeling, and testing XI : 26-27 April 2000, Orlando, USA. pp.60-69, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Infrared imaging systems : design, analysis, modeling, and testing XI : 26-27 April 2000, Orlando, USA. pp.144-150, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Targets and backgrounds : characterization and representation III : 21-23 April 1997, Orlando, Florida. pp.81-87, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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