1.

国際会議録
国際会議録
1. INVESTIGATION OF THE GAS-PHASE EFFLUENTS AND SURFACE RESIDUALS OF OZONE ASHED PHOTORESISTS
Olness, Gwen ; Bernasek, Steven ; Gordon, Mike ; Chung, Bryan ; Draper, Clifton
出版情報: Surface chemical cleaning and passivation for semiconductor processing.  pp.261-,  1993.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 315
2.

国際会議録
国際会議録
2. A FORENSIC INVESTIGATION OF THE CONTAMINATION IMPACT OF AN AGING WAFER SCRUBBER
Draper, Clifton ; Gordon, Mike ; Laduca, Angelo ; Dolcin, John ; Kragness, Roger ; Possanza, Bill
出版情報: Surface chemical cleaning and passivation for semiconductor processing.  pp.321-,  1993.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 315
3.

国際会議録
国際会議録
3. DEFECTS IN LASER SURFACE-MELTED METALS STUDIED BY PAC
Collins, Gary S. ; Allard, Carl ; Hohenemser, Cristoph ; Draper, Clifton
出版情報: Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A..  pp.53-58,  1987.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 82