1.

国際会議録
国際会議録
1. Dynamic optical saturation microscopy [6092-14]
Sykora, J. ; Dertinger, T. ; Enderlein, J.
出版情報: Ultrasensitive and single-molecule detection technologies : 21-22 and 24 January 2006, San Jose, California, USA.  pp.60920E-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6092
2.

国際会議録
国際会議録
2. Measuring precise diffusion coefficients with two-focus fluorescence correlation spectroscopy [6092-03]
Dertinger, T. ; Gregor, I. ; Von der Hocht I ; Erdmann R ; Kramer B ; Koberling F ; Hartmann R ; Enderlein J
出版情報: Ultrasensitive and single-molecule detection technologies : 21-22 and 24 January 2006, San Jose, California, USA.  pp.609203-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6092
3.

国際会議録
国際会議録
3. Advanced multifocus confocal laser scanning microscope for single molecule studies
Dertinger, T. ; Koberling, F. ; Benda, A. ; Erdmann, R. ; Hof, M. ; Enderlein, J.
出版情報: Imaging, Manipulation, and Analysis of Biomolecules and Cells: Fundamentals and Applications III.  pp.219-226,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5699
4.

国際会議録
国際会議録
4. Art and artifacts of fluorescence correlation spectroscopy
Enderlein, J. ; Gregor, I. ; Patra, D. ; Dertinger, T.
出版情報: Imaging, Manipulation, and Analysis of Biomolecules and Cells: Fundamentals and Applications III.  pp.167-174,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5699
5.

国際会議録
国際会議録
5. Compact TCSPC upgrade package for laser scanning microscopes based on 375- to 470-nm picosecond diode lasers
Ortmann, U. ; Dertinger, T. ; Wahl, M. ; Patting, M. ; Erdmann, R.
出版情報: Optical Diagnostics and Sensing IV.  pp.179-186,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5325