Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA. pp.58840P-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA. pp.58840I-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA. pp.58840N-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China. pp.603208-603208, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, J. ; Sciortino, P. ; Liu, P. ; Deng, X. ; Walters, F. ; Liu, X. ; Bacon, J. ; Chen, L.
出版情報:
Nanoengineering: fabrication, properties, optics, and devices II : 3-4 August, 2005, San Diego, California. pp.59310D-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, J. ; Deng, X. ; Sciortino, P. ; Varghese, R. ; Nikolov, A. ; Liu, F. ; Chen, L.
出版情報:
Nanoengineering: fabrication, properties, optics, and devices II : 3-4 August, 2005, San Diego, California. pp.59310C-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China. pp.180-187, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Deng, X. ; Izu, M. ; Jones, S. J. ; Liu, T. ; Williamson, D. L.
出版情報:
Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.. pp.A7.4-, 2001. Warrendale. Materials Research Society