Total dose and single event effects irradiation of various commercial integrated circuits in logic families and line interfaces
- 著者名:
Malou, F. ( CNES, Toulouse, France ) Bezerra, F. ( CNES, Toulouse, France ) Salvaterra, G. ( Astrium, Velizy Villacoublay, France ) Chatry, C. ( TRAD, Labege, France ) Falo, W. ( TRAD, Labege, France ) David, J-P. ( ONERA, Toulouse, France ) Duzellier, S. ( ONERA, Toulouse, France ) - 掲載資料名:
- Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France
- シリーズ名:
- ESA SP
- シリーズ巻号:
- 507
- 発行年:
- 2002
- 開始ページ:
- 387
- 終了ページ:
- 392
- 総ページ数:
- 6
- 出版情報:
- Noordwijk, The Netherlands: ESA Publications Division
- ISSN:
- 03796566
- ISBN:
- 9789290928171 [9290928174]
- 言語:
- 英語
- 請求記号:
- E11690/507
- 資料種別:
- 国際会議録
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