Minority Carrier Lifetime Measurements After High Temperature Pretreatm;ent
- 著者名:
- 掲載資料名:
- Crucial issues in semiconductor materials and processing technologies
- シリーズ名:
- NATO ASI series. Series E, Applied sciences
- シリーズ巻号:
- 222
- 発行年:
- 1992
- 開始ページ:
- 299
- 終了ページ:
- 304
- 総ページ数:
- 6
- 出版情報:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9780792320036 [0792320034]
- 言語:
- 英語
- 請求記号:
- N11482/222
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
Trans Tech Publications |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering, Narosa |
Trans Tech Publications |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
10
国際会議録
Effective Lifetime of Minority Carriers in Silicon: the Role of Heat- and Hydrogen Plasma Treatments
Electrochemical Society |
Materials Research Society |
Materials Research Society |
Electrochemical Society |
12
国際会議録
Minority Carrier Diffusion Length Changes in Si Substrate Due to a High Temperature Annealing
Electrochemical Society |