Blank Cover Image

Confocal scanning beam laser microscope/macroscope:applications in fluorescence

著者名:
掲載資料名:
Proceedings of fluorescence detection IV : 1-2 February 1996, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2705
発行年:
1996
開始ページ:
44
終了ページ:
52
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420794 [0819420794]
言語:
英語
請求記号:
P63600/2705
資料種別:
国際会議録

類似資料:

A.E. Dixon, S. Damaskinos, A. Ribes, E. Seto, M.-C. Béland

Society of Photo-optical Instrumentation Engineers

Feng, J., Ip, H.H., Cheng, S.H.

SPIE - The International Society of Optical Engineering

Ribes, A. C., Damaskinos, S., Tiedje, H. F., Dixon, A. E., Brodie, D. E., Duttagupta, S. P., Fauchet, P. M.

MRS - Materials Research Society

L. Ou, H. Zhuang, R. Chen, J. Lei, X. Huang, Y. Tian, S. Lin, L. Wang

SPIE - The International Society of Optical Engineering

Li G., Damaskinos S., Dixon A. E., Lee L. E. J., Wilfrid Laurier

SPIE - The International Society of Optical Engineering

C. Rembe, S. Boedecker, B. Armbruster, M. Bauer

SPIE - The International Society of Optical Engineering

O. Trepte, I. Rokahr, S. Andersson-Engels

Society of Photo-optical Instrumentation Engineers

Hofmann,U., Muehlmann,S., Witt,M., Dorschel,K., Schutz,R., Wagner,B.

SPIE - The International Society for Optical Engineering

C. Oh, S. Park, J. Kim, S. Ha, G. Park

Society of Photo-optical Instrumentation Engineers

Lessard,G.A., Yang,T.J., Barritault,P., Quake,S.R.

SPIE - The International Society for Optical Engineering

Huang, G., Deng, S., Xiao, S.

SPIE - The International Society of Optical Engineering

Garside,J.R., Somekh,M.G., See,C.W.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12