1.

国際会議録
国際会議録
1. Dry Etching of Sub-Micron Emitter in InP Heterojunction Double Bipolar Transistor Using Inductively Coupled Plasma
P. Nam ; P. C. Chang ; D. Sawdai ; V. Gambin ; D. Scott ; J. Gonzalez ; D. Li ; G. S. Leslie ; X. Zeng ; J. Wang ; D. Matheson ; L. Dang ; R. Elmadjian ; C. Grossman ; M. Barsky ; A. Gutierrez-Aitken ; A. Oki ; S. Olson
出版情報: State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XLIII) and Nitride and Wide Bandgap Semiconductors for Sensors, Photonics, and Electronics VI.  pp.88-93,  2006.  Pennington, N.J..  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 1(2)
2.

国際会議録
国際会議録
2. 3D Wafer-Scale Integration for RF and Digital Applications
P. Chang-Chien ; A. Gutierrez-Aitken ; R. Sandhu ; K. Hennig ; D. Scott
出版情報: Semiconductor Wafer Bonding 10: Science, Technology, and Applications.  pp.243-249,  2008.  Pennington, NJ.  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 16(8)
3.

国際会議録
国際会議録
3. Vision-based sensing for autonomous in-flight refueling
D. Scott ; M. Toal ; J. Dale
出版情報: Unmanned systems technology IX : 9-12 April 2007, Orlando, Florida, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6561
4.

国際会議録
国際会議録
4. Operational experience of contamination and damage of the larger aperture optics in the HELEN laser facility vacuum system at 1053 and 527 nanometres
J. Andrew ; M. Girling ; N. Honiatt ; D. Scott ; P. Wallace
出版情報: Laser-induced damage in optical materials : 2007 : 39th Annual Boulder Damage Symposium : proceedings : 24-26 September, 2007, Boulder, Colorado.  pp.67200P-1-67200P-13,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6720