Sampling phased array: a new technique for signal processing and ultrasonic imaging

Sampling phased array: a new technique for signal processing and ultrasonic imaging

著者名:

M. Kroening ( Fraunhofer Institute for Non-Destructive Testing, Univ. Gebaeude (Germany) )
A. Bulavinov ( Fraunhofer Institute for Non-Destructive Testing, Univ. Gebaeude (Germany) )
K. M. Reddy ( Fraunhofer Institute for Non-Destructive Testing, Univ. Gebaeude (Germany) )
L. von Bernus ( Q Net Engineering GmbH (Germany) )
D. Joneit ( Fraunhofer Institute for Non-Destructive Testing, Dresden (Germany) )

掲載資料名:

Nondestructive characterization for composite materials, aerospace engineering, civil infrastructure, and homeland security 2007 : 20-22 March 2007, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6531

発行年:

2007

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466525 [0819466522]

言語:

英語

請求記号:

P63600/6531

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046838
シリーズID:	PA00000029
会議名:	Smart Structures : Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security
回次:	2007
会議開催地:	San Diego, CA, USA
会議開催年:	2007.03.20-2007.03.22

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